Menu
Menu
Your Cart

Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 660-1000 nm

Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 660-1000 nm
Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 660-1000 nm
Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 660-1000 nm
Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 660-1000 nm
Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 660-1000 nm
  • Brand:
  • Product Code: 20Q20NC.2
$261.00
Ex Tax: $261.00

Available Options

Buy Now Request Quote
Add to Wish List Compare this Product

The 20Q20NC.2 Broadband Beam Sampler is a 2.0 inch (50.8 mm) diameter, 9.40 mm thick, UV fused silica beam sampler with a λ/10 surface flatness. It is 660 to 1000 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.

feature
Angle of Incidence 45°
Antireflection Coating 660-1000 nm
Chamfers 0.38-1.14 mm face width
Chamfers Angle Tolerance 45° ±15°
Cleaning See How to Clean Optics
Clear Aperture > central 80% of diameter
Coating Code NC.2
Damage Threshold 500 W/cm2 CW, 1.0 J/cm2 with 10 nsec pulses, typical
Diameter 50.8 mm
Diameter Tolerance +0/-0.13 mm
Durability MIL-C-675C, moderate abrasion million cycles
Material UV Grade Fused Silica
Substrate Number 20Q20
Surface Flatness ≤λ/10 at 632.8 nm over the clear aperture
Surface Quality 15-5 scratch-dig
Thickness 9.4 mm
Thickness Tolerance ±0.38 mm
Wedge 30 ±15 arc min

Write a review

Tags: Broadband Beam Sampler , UVFS , 50.8 mm , λ/10 , 660-1000 nm , 20Q20NC.2 , Broadband Beam Samplers