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Broadband Beam Sampler, UVFS, 25.4 mm, λ/20, 660-1000 nm

Broadband Beam Sampler, UVFS, 25.4 mm, λ/20, 660-1000 nm
Broadband Beam Sampler, UVFS, 25.4 mm, λ/20, 660-1000 nm
Broadband Beam Sampler, UVFS, 25.4 mm, λ/20, 660-1000 nm
Broadband Beam Sampler, UVFS, 25.4 mm, λ/20, 660-1000 nm
Broadband Beam Sampler, UVFS, 25.4 mm, λ/20, 660-1000 nm
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  • Product Code: 10Q40NC.2
$260.00
Ex Tax: $260.00

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The 10Q40NC.2 Broadband Beam Sampler is a 1.0 inch (25.4 mm) diameter, 6.10 mm thick, UV fused silica beam sampler with a λ/20 surface flatness. It is 660 to 1000 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.

feature
Angle of Incidence 45°
Antireflection Coating 660-1000 nm
Chamfers 0.25-0.76 mm face width
Chamfers Angle Tolerance 45° ±15°
Cleaning See How to Clean Optics
Clear Aperture > central 80% of diameter
Coating Code NC.2
Damage Threshold 500 W/cm2 CW, 1.0 J/cm2 with 10 nsec pulses, typical
Diameter 25.4 mm
Diameter Tolerance +0/-0.13 mm
Durability MIL-C-675C, moderate abrasion million cycles
Material UV Grade Fused Silica
Substrate Number 10Q40
Surface Flatness ≤λ/20 at 632.8 nm over the clear aperture
Surface Quality 10-2 scratch-dig
Thickness 6.1 mm
Thickness Tolerance ±0.38 mm
Wedge 30 ±15 arc min

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Tags: Broadband Beam Sampler , UVFS , 25.4 mm , λ/20 , 660-1000 nm , 10Q40NC.2 , Broadband Beam Samplers