Fast Optical Metrology at Wafer Level: Camera, Motor, API Integration
Fast Optical Metrology at Wafer Level: Camera, Motor, API Integration Published by: Sohoprolab Editorial Team | Date: July 8, 2025 Introduction As wafer geometries shrink and throughput demands increase, manufacturers rely on high-speed optical metrology to inspect patterns, layer thickness, and critical dimensions. This article explores how integrating machine vision cameras, motorized stages, and software […]
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